New unique feature!
Starting from version 1.4, Ocean supports thin film calculations. Using thin films on surfaces was already possible through the support for tabulated reflection and transmission data. This required to either perform measurements on real samples, or compute the table from a model with an external thin-film calculation software such as OpenFilters.
The new feature offers an alternative to tabulated data : the thin film can be modeled directly in the Ocean XML language by describing a medium and a thickness. And of course, it is fully physically correct regarding light polarization. It may be used on either specular and rough materials.
There are several advantages to using this approach:
The new feature offers an alternative to tabulated data : the thin film can be modeled directly in the Ocean XML language by describing a medium and a thickness. And of course, it is fully physically correct regarding light polarization. It may be used on either specular and rough materials.
There are several advantages to using this approach:
- The coating will behave correctly in any media. For instance, a coated glass plunged into water will be calculated accordingly. This can significantly change its colors if interferences are involved.
- Varying thickness will be possible. Modelling thickness gradients and imperfect deposition uniformity will be made simple!
- This avoids issues due to the limited precision of tabulated data close to total reflection angles.
A gold thin film was applied on the perfume bottle. The model handles interferences in the thin film, causing the reddish tint around 10nm
The next picture shows the same scene, rendered with silver thin films. The model correctly handles interferential effects in the thin film, causing the reddish reflection around 10nm. The bluish transmission comes from the silver dielectic function.
A gold thin film was applied on the perfume bottle. The reddish tint at 10nm is interferential. The bluish tint comes from silver absorption.
Roadmap
The following features will be progressively added to the thin film interface:
- Multiple thin film stack
- Optional pre-calculation to tabulated data, for optimal performance
- Variable film thickness
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